论文标题
使用直接检测
Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection
论文作者
论文摘要
X射线科学的最新发展提供了探测深层嵌入中尺寸晶粒结构的方法，并使用深色场X射线显微镜（DFXM）空间解决它们。扩展该技术以研究弱衍射信号，例如磁系统，量子材料和薄膜，这是由于可用的检测方法和样品中的入射X射线通量而挑战。我们提出了一种直接检测方法，该方法重点介绍了10s keV的硬X射线范围及以上的DFXM研究，能够接近纳米级分辨率。此外，我们将这种直接检测方案与常规使用的基于闪烁体的光学检测进行了比较，并在暴露时间的数量级改善了，从而使弱衍射有序系统成像。
Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We present a direct detection method focusing on DFXM studies in the hard x-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.
