论文标题
超导量子电路中的断层模型
Fault Models in Superconducting quantum circuits
论文作者
论文摘要
故障模型对于许多EDA任务都是必不可少的，因此对于量子硬件的设计和实现都是必不可少的。在本文中，我们提出了一个用于超导量子系统的故障模型。我们的故障模型反映了量子系统的控制信号和结构中的实际故障行为。基于它，我们通过Qutip对受控的-Z门和量子电路进行故障模拟。我们为连贯故障的最小测试重复的不连贯故障和测试模式提供了忠诚基准测试。结果表明，有34个测试重复可以检测到10％的控制噪声，这有助于节省测试时间和内存。
Fault models are indispensable for many EDA tasks, so as for design and implementation of quantum hardware. In this article, we propose a fault model for superconducting quantum systems. Our fault model reflects the real fault behavior in control signals and structure of quantum systems. Based on it, we conduct fault simulation on controlled-Z gate and quantum circuits by QuTiP. We provide fidelity benchmarks for incoherent faults and test patterns of minimal test repetitions for coherent faults. Results show that with 34 test repetitions a 10% control noise can be detected, which help to save test time and memory.
