论文标题
通过东方的X射线晶体光谱仪，通过ECRH观察钨杂质抑制
Observation of tungsten impurity suppression with ECRH by an X-ray Crystal Spectrometer on EAST
论文作者
论文摘要
杂质通过造成能量损失，稀释燃料浓度，甚至在某些极端情况下终止排放来降低Tokamak等离子限制。以前，通过极端紫外线（EUV）光谱检查，已经研究了EAST上的轴心电子回旋共振加热（ECRH）对杂质积累的抑制作用。但是，很难量化杂质钨（W）曲线的变化，因为EUV范围内的W线排放无法轻易解决。 X射线晶体光谱（XC），用于通过测量软X射线范围内的线排放来提供离子温度和旋转速度，也可用于研究杂质W排放的行为。首先，通过分析BREMSSTRAHLUNG辐射强度的测量值来进行切向XCS（TXC）的原位绝对强度校准（TXC）。获得校准系数后，使用W XLV的光谱线（3.9095Å）评估W44+离子密度曲线。因此，完成了对ECRH抑制的W44+杂质浓度的直接观察。获得的W密度曲线可用于通过与将来的杂质传输代码结合使用来分析W传输。
Impurity degrades tokamak plasmas confinement by causing energy loss, diluting the fuel concentration, even terminating the discharges in some extreme cases. Previously, the suppression effects of on-axis Electron Cyclotron Resonance Heating (ECRH) on the impurity accumulation have been investigated on EAST by the extreme ultraviolet (EUV) spectroscopy. However, it is difficult to quantify the changes in impurity tungsten (W) profile since the W line emissions in the EUV range could not be easily resolved. The X-ray Crystal Spectroscopy (XCS), that used to provide the ion temperature and the rotation velocity by measuring lines emissions in the soft X-ray range, also can be used to study the behavior of impurity W emissions. To begin with, in-situ absolute intensity calibration for Tangential XCS (TXCS) is conducted by analyzing the measurements of the bremsstrahlung radiation intensity. After obtaining the calibration coefficient, W44+ ion density profiles are evaluated by Abel inversion using the spectral line of W XLV (3.9095 Å). Thus, a direct observation of W44+ impurity concentration suppressed by ECRH is accomplished. The obtained W density profiles can be used to analyze the W transport by combining with the impurity transport codes in the future.
