论文标题
在室温下,铁电域壁锥锥的超高载体迁移率
Ultra-High Carrier Mobilities in Ferroelectric Domain Wall Corbino Cones at Room Temperature
论文作者
论文摘要
最近,在不同的带绝缘剂(例如铝酸盐和钛酸腹腔)之间进行异质界面的电气引起了相当大的研究兴趣。充电运输已被彻底探索和牢固确定传导的基本方面。也许令人惊讶的是,从概念上讲,类似的洞察力更简单,例如在同一铁电隔离器中分离电气极化的不同方向的域壁,并不是那么发达。在解决这一差异的情况下,我们在这里报告了大约圆锥形的180o带电域壁的磁性,这些壁是在部分切换的铁电薄膜单晶锂中发生的。该系统是此类测量值的理想选择:首先,域和域壁之间的电导率差异极大且异常大(至少为1013倍),因此在平面顶部和底部电极之间通过薄膜驱动的电流被压倒性地沿着墙壁被压倒性。其次,当对域壁的顶部和底部进行电接触,并沿其圆锥形轴(垂直于薄膜表面)施加磁场时,测试几何形状反映了Corbino Disc的几何磁磁度测量的教科书排列。我们的数据暗示着域墙的载体,其室温厅的迁移率极高,高达〜3,700厘米2V-1S-1。这是氧化物界面的无与伦比的值(也是散装氧化物),并且与通常在低温下而不是在房间温度下看到的其他系统中的迁移率相当。
Recently, electrically conducting heterointerfaces between dissimilar band-insulators (such as lanthanum aluminate and strontium titanate) have attracted considerable research interest. Charge transport has been thoroughly explored and fundamental aspects of conduction firmly established. Perhaps surprisingly, similar insights into conceptually much simpler conducting homointerfaces, such as the domain walls that separate regions of different orientations of electrical polarisation within the same ferroelectric band-insulator, are not nearly so well-developed. Addressing this disparity, we herein report magnetoresistance in approximately conical 180o charged domain walls, which occur in partially switched ferroelectric thin film single crystal lithium niobate. This system is ideal for such measurements: firstly, the conductivity difference between domains and domain walls is extremely and unusually large (a factor of at least 1013) and hence currents driven through the thin film, between planar top and bottom electrodes, are overwhelmingly channelled along the walls; secondly, when electrical contact is made to the top and bottom of the domain walls and a magnetic field is applied along their cone axes (perpendicular to the thin film surface), then the test geometry mirrors that of a Corbino disc, which is a textbook arrangement for geometric magnetoresistance measurement. Our data imply carriers at the domain walls with extremely high room temperature Hall mobilities of up to ~ 3,700cm2V-1s-1. This is an unparalleled value for oxide interfaces (and for bulk oxides too) and is most comparable to mobilities in other systems typically seen at cryogenic, rather than at room, temperature.