论文标题
使用反射光谱指纹的Au辅助剥落大面积MOS $ _2 $和WS $ _2 $的可靠且宽范围的层
Reliable and Broad-range Layer Identification of Au-assisted Exfoliated Large Area MoS$_2$ and WS$_2$ Using Reflection Spectroscopic Fingerprints
论文作者
论文摘要
与传统的基于磁带的去角质相比，新兴的Au辅助去角质技术提供了丰富的大区域和高质量的超薄二维（2D）材料。快速，无损害和可靠的确定此类2D膜的层数对于研究层依赖性物理和促进设备应用至关重要。在这里，已经开发了一种光学方法，用于简单，高通量且准确地确定Au辅助的去角质MOS $ _2 $和WS $ _2 $胶片的层编号。该方法基于对层依赖性白光反射光谱的定量分析，表明反射峰强度可以用作确定层数的明确指标。简单而健壮的方法将促进有关依赖层的光学，电气和热性能以及2D材料的设备应用的基本研究。该技术还可以很容易地与光致发光和拉曼光谱镜结合在一起，以研究2D材料的其他层依赖性物理特性。
The emerging Au-assisted exfoliation technique provides a wealth of large-area and high-quality ultrathin two-dimensional (2D) materials compared with traditional tape-based exfoliation. Fast, damage-free, and reliable determination of the layer number of such 2D films is essential to study layer-dependent physics and promote device applications. Here, an optical method has been developed for simple, high throughput, and accurate determination of the layer number for Au-assisted exfoliated MoS$_2$ and WS$_2$ films in a broad thickness range. The method is based on quantitative analysis of layer-dependent white light reflection spectra, revealing that the reflection peak intensity can be used as a clear indicator for determining the layer number. The simple yet robust method will facilitate the fundamental study on layer-dependent optical, electrical, and thermal properties and device applications of 2D materials. The technique can also be readily combined with photoluminescence and Raman spectroscopies to study other layer-dependent physical properties of 2D materials.
