论文标题
通过移动的分析平面配置在Katrin实验上的背景减少
Background reduction at the KATRIN experiment by the shifted analysing plane configuration
论文作者
论文摘要
Katrin实验旨在测量五年数据后的灵敏度为0.2 eV $/c^2 $的电子中微子质量。最近，获得了0.8 eV $/c^2 $（90％Cl）的新的上微子质量。为了达到设计灵敏度，需要将背景速率降低一个数量级。移动的分析平面（SAP）配置利用了Katrin主光谱仪中电场和磁场的特定形状，以将光谱仪背景降低两个。我们讨论了SAP配置的一般思想，并描述了这种新颖测量模式的主要特征。
The KATRIN experiment aims at measuring the electron neutrino mass with a sensitivity of 0.2 eV$/c^2$ after five years of data taking. Recently a new upper limit for the neutrino mass of 0.8 eV$/c^2$ (90% CL) was obtained. To reach the design sensitivity, a reduction of the background rate by one order of magnitude is required. The shifted analysing plane (SAP) configuration exploits a specific shaping of the electric and magnetic fields in the KATRIN main spectrometer to reduce the spectrometer background by a factor of two. We discuss the general idea of the SAP configuration and describe the main features of this novel measurement mode.
