论文标题
在半导体设备中估算RTS噪声的时间常数：时间域中的观察窗口的完整描述
Estimating time constants of the RTS noise in semiconductor devices: a complete description of the observation window in the time domain
论文作者
论文摘要
我们获得了用于RTS噪声样品方差的样品方差和样品方差的半分析处理量。我们的方法提出了一种实验确定捕获和发射常数的方法，在许多陷阱的叠加的主导陷阱和普遍行为的情况下。我们提出了MC模拟证实的详细闭合表达式。我们一定有一个重要的工具来指导开发人员在半导体设备中构建和分析低频噪声。
We obtained a semi-analytical treatment obtaining estimators for the sample variance and variance of sample variance for the RTS noise. Our method suggests a way to experimentally determine the constants of capture and emission in the case of a dominant trap and universal behaviors for the superposition from many traps. We present detailed closed-form expressions corroborated by MC simulations. We are sure to have an important tool to guide developers in building and analyzing low-frequency noise in semiconductor devices.
