论文标题
使用统计模型从扫描探针显微镜图像中删除背景并估算原子步骤的单位高度
Removing background and estimating a unit height of atomic steps from a scanning probe microscopy image using a statistical model
论文作者
论文摘要
我们提出了一种统计方法，以删除背景并估计使用扫描探针显微镜获得的图像的原子步骤的单位高度。我们采用由多个统计分布组成的混合模型来描述图像。这种统计方法也提供了一种全面的方法来减去背景表面，即使在原子步骤的存在下以及评估单个框架中的露台高度也是如此。此外，它还使我们能够通过引入有关图像的其他先验知识来提取进一步的定量信息。该扩展的一个示例是估计原子台阶的单位高度与露台高度一起估计。我们证明了使用扫描隧道显微镜拍摄的Cu（111）表面的地形图像的能力。背景减法纠正了所有梯田，要平行于水平平面，并且估计的单位高度的精度达到了皮表的顺序。我们方法的开源实现可在网络上获得。
We present a statistical method to remove background and estimate a unit height of atomic steps of an image obtained using a scanning probe microscope. We adopt a mixture model consisting of multiple statistical distributions to describe an image. This statistical approach provides a comprehensive way to subtract a background surface even in the presence of atomic steps as well as to evaluate terrace heights in a single framework. Moreover, it also enables us to extract further quantitative information by introducing additional prior knowledge about the image. An example of this extension is estimating a unit height of atomic steps together with the terrace heights. We demonstrate the capability of our method for a topographic image of a Cu(111) surface taken using a scanning tunneling microscope. The background subtraction corrects all terraces to be parallel to a horizontal plane and the precision of the estimated unit height reaches the order of a picometer. An open-source implementation of our method is available on the web.
