论文标题

通过光学和电力力学探测的回忆悬浮的MOS2单层中的相变

Phase Transition in a Memristive Suspended MoS2 Monolayer Probed by Opto- and Electro-Mechanics

论文作者

Chaste, Julien, Hnid, Imen, Khalil, Lama, Si, Chen, Durnez, Alan, Lafosse, Xavier, Zhao, Meng-Qiang, Johnson, A. T. Charlie, Zhang, Shengbai, Bang, Junhyeok, Ouerghi, Abdelkarim

论文摘要

2D材料的半导体单层能够将多个有趣的属性连接到单个组件中。在这里,通过结合光学机械测量和电子测量,我们证明了MOS2悬浮的2D单层膜中的部分2H-1T相变。在没有任何外部掺杂剂的情况下,电子传输在MOS2膜中显示出意外的回忆特性。同时测量膜的强大机械软化,并且可能仅与2H-1T相变相关,该期相对于半导体2H施加了拓扑1T相的3%方向伸长。我们注意到,只有几个百分之几的2H-1T相交换足以观察到可测量的回忆作用。我们的实验结果结合了第一原理总能量计算表明,硫空位扩散在相变的初始成核中起关键作用。我们的研究清楚地表明,纳米力学代表了一种超敏化技术,用于探测2D材料或薄膜的晶体相变。最后,更好地控制了导致MOS2中观察到的回忆作用的微观机制对于实施未来的设备很重要。

Semiconducting monolayer of 2D material are able to concatenate multiple interesting properties into a single component. Here, by combining opto-mechanical and electronic measurements, we demonstrate the presence of a partial 2H-1T phase transition in a suspended 2D monolayer membrane of MoS2. Electronic transport shows unexpected memristive properties in the MoS2 membrane, in the absence of any external dopants. A strong mechanical softening of the membrane is measured concurrently and may only be related to the phase 2H-1T phase transition which imposes a 3percent directional elongation of the topological 1T phase with respect to the semiconducting 2H. We note that only a few percent 2H- 1T phase switching is sufficient to observe measurable memristive effects. Our experimental results combined with First-principles total energy calculations indicate that sulfur vacancy diffusion plays a key role in the initial nucleation of the phase transition. Our study clearly shows that nanomechanics represents an ultrasensitive technique to probe the crystal phase transition in 2D materials or thin membranes. Finally, a better control of the microscopic mechanisms responsible for the observed memristive effect in MoS2 is important for the implementation of future devices.

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