论文标题
使用量子流体的噪声性能和单电子晶体管的热化
Noise performance & thermalization of single electron transistors using quantum fluids
论文作者
论文摘要
我们报告了沉浸在超级流体$^4 $ HE中的单个电子晶体管（set）的低温噪声测量值。该设备充当电荷敏感的电表，能够检测到与该集合的电荷缺陷的波动。特别是，我们测量电流通过设备的电报切换，该设备源自强耦合的单个两级波动器。通过将设备嵌入超氟氦浸入式电池中，我们能够系统地控制围绕集合的热效环境，并研究超流体对设定噪声性能的影响。我们发现，超级流体$^4 $的存在他可以通过冷却周围的声子浴而强烈抑制缺陷的切换率。
We report on low-temperature noise measurements of a single electron transistor (SET) immersed in superfluid $^4$He. The device acts as a charge sensitive electrometer able to detect the fluctuations of charged defects in close proximity to the SET. In particular, we measure telegraph switching of the electric current through the device originating from a strongly coupled individual two-level fluctuator. By embedding the device in a superfluid helium immersion cell we are able to systematically control the thermalizing environment surrounding the SET and investigate the effect of the superfluid on the SET noise performance. We find that the presence of superfluid $^4$He can strongly suppress the switching rate of the defect by cooling the surrounding phonon bath.
