论文标题
嵌入在氦纳米光中的Xe原子的直接内壳光离子化
Direct inner-shell photoionization of Xe atoms embedded in helium nanodroplets
论文作者
论文摘要
我们介绍了嵌入超氟（HE）纳米型中的原子簇的光电谱的第一个测量。由于Xenon（Xe）的大吸收横截面约100 eV光子能量（4D内壳电离），直接掺杂剂光电离超过了电离He液滴的电荷转移电离。尽管由随后的游离Xe原子的螺旋蛋白衰减主要创建Xe^2+和Xe^3+，但XE嵌入He液滴中仅单单电荷Xe_k^+，k = 1,2,3片段。宽XE+离子动力学分布表明由于电子转移到周围中性原子到主要的螺旋杆离子而引起的离子库仑爆炸。与从He纳米光中发出的XE离子相关的电子光谱包含低能特征和几乎没有降级的XE光载。这些结果铺平了通往嵌入He纳米光的簇和分子络合物的极端紫外线（XUV）和X射线光电光谱。
We present the first measurements of photoelectron spectra of atomic clusters embedded in superfluid helium (He) nanodroplets. Owing to the large absorption cross section of xenon (Xe) around 100 eV photon energy (4d inner-shell ionization), direct dopant photoionization exceeds charge transfer ionization via the ionized He droplets. Despite the predominant creation of Xe^2+ and Xe^3+ by subsequent Auger decay of free Xe atoms, for Xe embedded in He droplets only singly charged Xe_k^+, k=1,2,3 fragments are observed. Broad Xe^+ ion kinetic-energy distributions indicate Coulomb explosion of the ions due to electron transfer to the primary Auger ions from surrounding neutral atoms. The electron spectra correlated with Xe ions emitted from the He nanodroplets contain a low-energy feature and nearly unshifted Xe photolines. These results pave the way to extreme ultraviolet (XUV) and x-ray photoelectron spectroscopy of clusters and molecular complexes embedded in He nanodroplets.
