论文标题

高强度$ e^+e^ - $粒子对撞机的双面CMOS像素化检测器的操作

Operation of a double-sided CMOS pixelated detector at a high intensity $e^+e^-$ particle collider

论文作者

Cuesta, D., Baudot, J., Claus, G., Goffe, M., Jaaskelainen, K., Santelj, L., Specht, M., Szelezniak, M., Ripp-Baudot, I.

论文摘要

本文报道了在对撞机实验中,双面CMOS像素化梯子的第一次操作,即在Superkekb Collider的第2阶段运行中Belle II实验的内部跟踪器体积。首先描述了实验相互作用区域中检测器系统的设计和集成。这两个模块在四个月以上几乎连续运行,记录数据以监视接近光束的命中率。提供了离线数据分析的详细信息,并提出了一种从每个交叉粒子测量的2个命中估算粒子动量的方法。

This article reports the first operation of a double-sided CMOS pixelated ladder in a collider experiment, namely in the inner tracker volume of the Belle II experiment during the Phase 2 run of the SuperKEKB collider. Design and integration of the detector system in the experiment interaction region is first described. The two modules operated almost continuously during slightly more than four months, recording data for the monitoring of the hit rate close to beams. Details of the off-line data analysis are provided and a method to estimate particle momentum from the 2 hits measured per crossing particle is proposed.

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